Branch: East Midlands
Speakers: Abigail Thomas-Verweji and Benjamin Grew
REGISTRATION IS REQUIRED TO JOIN THE MEETING
Secondary Ion Mass Spectrometry (SIMS) is a powerful elemental depth-profiling technique that is sensitive to nearly all of the periodic table at ppm/ppb concentrations. SIMS may be used to determine the concentration of nitrogen and oxygen in Ti alloys at ppm levels. SIMS uses a focussed primary ion beam to sputter/etch material from a sample. The ionised species in the sputtered material are electrostatically extracted to form the ‘secondary’ ion beam, which is then mass analysed. Through the use of appropriate reference samples, it is possible to quantify these data. This talk will describe in detail the SIMS measurement technique with examples of its application in the metallurgical industry.
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